Automatic probe ground connection checking techniques
US11454651B2 · kind B2 · utility
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4References
10Claims
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Key dates
| Filing date | Dec 7, 2020 |
| Grant date | Sep 27, 2022 |
| Priority date | — |
| Expiry date | Dec 7, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/54
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.