Patent · US Active

Candidate element selection using significance metric values

US11455283B2 · kind B2 · utility

1Cited by

1References

31Claims

0Family size

Assignee

SAP SE · DE

Inventors

Jan Portisch · Bruchsal, DE
Ronald Boehle · Dielheim, DE
Volker Saggau · Bensheim, DE
Sandra Bracholdt · Dielheim, DE

Key dates

Filing date	Apr 14, 2020
Grant date	Sep 27, 2022
Priority date	—
Expiry date	Jul 9, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG06Q10/10
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Techniques and solutions are described for determining a set of elements of a second set that may correspond to a given element of a first set of elements. The elements can be, in specific examples, components of a database system, such as tables (or entities), attributes, or records. Significance metric values are calculated for elements in the first and second sets. The significance metric values can be a number of records in an entity or a number of read or write access operations for an entity or for a record of an entity. A significance metric value for the given element can be used at least in part to select elements of the second set as potential match candidates, based at least in part on significance metric values for elements of the second set. Selecting elements can include selecting elements based on a window of elements of the second set or a range of significance metric values.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.