Image based analysis of samples
US11455719B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 15, 2017 |
| Grant date | Sep 27, 2022 |
| Priority date | — |
| Expiry date | Jun 20, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30024
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of image-based analysis of multiple samples includes using a sample holder having multiple locations of interest and multiple focal structures that are each associated, one or more, with the multiple locations of interest, wherein the multiple samples are dispersed across the multiple locations of interest and obtaining image areas of the multiple locations of interest. Multiple digital image areas are thus obtained for use in an analysis of the multiple samples with each of the image areas including at least one of the locations of interest and at least one of the focal structures. An image processing algorithm is used to analyse each of the digital image areas and check if the focal structure indicates that the image area is in clear focus. An indication is provided and/or remedial action is taken if the image processing algorithm indicates that any digital image areas are out of focus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.