Method and device for up-sampling a point cloud
US11455748B2 · kind B2 · utility
2Cited by
1References
20Claims
0Family size
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Key dates
| Filing date | Oct 2, 2018 |
| Grant date | Sep 27, 2022 |
| Priority date | — |
| Expiry date | Oct 2, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2219/2012
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This method for up-sampling a point cloud representing a 3D object, comprises: —detecting (2) points belonging to at least one under-sampled region of the point cloud on the basis of at least one desirable sampling rate (K); —obtaining (12), for each detected point, an associated tangent plane; —inserting (14) in the point cloud at least one neighboring point of each detected point if a distance between the neighboring point and the tangent plane associated with the detected point is less than a first threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.