Method of improving an analytical instrument and improved analytical instruments
US11456163B1 · kind B1 · utility
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Key dates
| Filing date | May 19, 2020 |
| Grant date | Sep 27, 2022 |
| Priority date | — |
| Expiry date | Mar 6, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to methods of improving analytical instruments and improved analytical instruments. The aforementioned method employs a calibration correction module that calibrates the machine to effect measurements with the minimum possible relative squared error. This results in a significant improvement of the analytical instrument in question that leads to more precise and accurate results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.