Patent · US Active

Feature set determining method and apparatus

US11461659B2 · kind B2 · utility

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20Claims
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Assignee

Inventors

Key dates

Filing dateJan 15, 2018
Grant dateOct 4, 2022
Priority date
Expiry dateAug 7, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V40/16
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A feature set determining method includes obtaining, according to a received feature set determining request, data used for feature learning. The feature set determining request includes a learning objective of the feature learning. The method includes performing type analysis on the data to divide the data into first-type data and second-type data. The method includes performing semi-supervised learning on the first-type data to extract multiple first-type features. The method includes performing adaptive learning on the second-type data to extract multiple second-type features. The method includes evaluating the first-type features and the second-type features to obtain an optimal feature set.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.