Patent · US Active

Pattern recognition system

US11461683B2 · kind B2 · utility

7Cited by
26References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 9, 2020
Grant dateOct 4, 2022
Priority date
Expiry dateJun 5, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2218/10
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Methods, apparatuses and systems directed to pattern learning, recognition, and metrology. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In certain implementations, the present invention provides for methods and systems suitable for analyzing and recognizing patterns in biological signals such as multi-electrode array waveform data. In other implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes. In other implementations, the present invention provides methods and systems for dynamic learning of patterns in supervised and unsupervised manners.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.