System and method for inspecting workpieces
US11461887B2 · kind B2 · utility
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2References
20Claims
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Key dates
| Filing date | Feb 14, 2020 |
| Grant date | Oct 4, 2022 |
| Priority date | — |
| Expiry date | May 9, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems and devices for inspecting workpieces are described. The method comprises acquiring partial measurement data from a plurality of workpieces associated with a batch of workpieces; composing an inspection data set from the partial measurement data; comparing the inspection data set to a reference data set defining tolerances for the workpieces; and accepting and rejecting the batch of workpieces based on the comparing of the inspection data set to the reference data set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.