Method and apparatus for inspecting burrs of electrode slice
US11461995B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 14, 2019 |
| Grant date | Oct 4, 2022 |
| Priority date | — |
| Expiry date | Apr 6, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the present disclosure provides a method and apparatus for inspecting burrs of an electrode slice. The method may include: acquiring a to-be-inspected electrode slice image; and inputting the to-be-inspected electrode slice image into a pre-trained burr instance segmentation model to obtain inspection result for characterizing whether the electrode slice displayed in the to-be-inspected electrode slice image has burrs and contour of the burrs, where the burr instance segmentation model is used to characterize the corresponding relationship between the electrode slice image and the inspection result and contour information. The method may further include: and outputting, in response to the inspection result for characterizing that the electrode slice displayed in the to-be-inspected electrode slice image has burrs, prompt information for characterizing that the electrode slice displayed in the to-be-inspected electrode slice image has burrs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.