Method for on-orbit calibration of basic parameters of mass spectrometer
US11462395B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 8, 2022 |
| Grant date | Oct 4, 2022 |
| Priority date | — |
| Expiry date | Apr 8, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0468
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to the technical field of calibration of basic parameters of mass spectrometers, and provides a method for on-orbit calibration of basic parameters of a mass spectrometer. Based on the characteristic that a molten silicate mineral can adsorb a gas in an environment, under vacuum conditions, a silicate mineral is heated to obtain the molten silicate mineral. The molten silicate mineral is put in an environment with a standard gas for adsorption, rapid cooling is conducted to obtain a standard sample, and the standard sample is preloaded into a thermal control device of the mass spectrometer. When the mass spectrometer enters a definitive orbit for testing a substance, on-orbit heating is conducted on the standard sample to make the adsorbed standard gas released into the mass spectrometer so as to achieve the calibration of the basic parameters of the mass spectrometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.