Device for measuring optical frequency reflection and measurement method thereof
US11463163B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2020 |
| Grant date | Oct 4, 2022 |
| Priority date | — |
| Expiry date | Jan 29, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/64
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
The purpose of the present invention is to provide a device for optical frequency domain reflectometry and a method thereof that can measure a reflectance distribution with less spatial resolution degradation due to a phase noise, without using a wideband receiving system even when a long-distance measurement is performed. The device for optical frequency domain reflectometry according to the present invention is provided with a delay optical fiber for delaying a local light by a prescribed time, and obtains information on a relative delay of a backscattered light from an optical fiber under measurement with respect to the local light and information on the positivity and the negativity of a beat frequency by measuring an in-phase component and a quadrature component of a beat signal obtained by multiplexing the backscattered light from the optical fiber under measurement and the local light delayed by the delay optical fiber, so as to obtain a reflectance distribution in a longitudinal direction of the optical fiber under measurement based on these pieces of information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.