Patent · US Active

Method and apparatus for analyzing an imaging quality of an imaging system

US11463666B2 · kind B2 · utility

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18Claims

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Assignees

Inventors

Shuo Zhang · Oettingen, DE
Hao Zhang · Shanghai, CN
Lili Chen · Beijing, CN
Hongzhen Xue · Beijing, CN
Minglei Chu · Beijing, CN
Guixin Yan · Beijing, CN
Yukun Sun · Beijing, CN
Chenxi Zhao · Beijing, CN
Zehua Dong · Beijing, CN
Xiangjun Peng · Beijing, CN
Yaoyu Lv · Beijing, CN
Yachong Xue · Beijing, CN
Huidong He · Beijing, CN
Qingwen Fan · Beijing, CN

Key dates

Filing date	Apr 30, 2020
Grant date	Oct 4, 2022
Priority date	—
Expiry date	Sep 8, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG03H2240/62
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

Embodiments of the present disclosure relate to a method for analyzing an imaging quality of an imaging system. The imaging system comprises a spatial light modulator. The spatial light modulator comprises pixel units arranged in an array. The method comprises obtaining a transmittance distribution function of the spatial light modulator based on a structural parameter of the pixel unit, wherein the structural parameter is an aperture ratio. The imaging quality analysis parameter of the imaging system is obtained based on the transmittance distribution function of the spatial light modulator. Then, the imaging quality of the imaging system is analyzed based on the imaging quality analysis parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.