Patent · US Active

Method for recalibrating a micromechanical sensor, and recalibrateable sensor

US11467012B2 · kind B2 · utility

0Cited by
1References
16Claims
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Assignee

Inventors

Key dates

Filing dateMar 7, 2019
Grant dateOct 11, 2022
Priority date
Expiry dateNov 29, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/0035
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Recalibrating a micromechanical sensor. The sensor is assigned a signal processing device for correcting the sensor signal on the basis of at least one previously determined initial trim value that is selected such that, given a defined sensor excitation, a production-related deviation of the sensor signal from a target sensor signal is compensated. The method for recalibrating the sensor includes: applying a defined electrical test excitation signal to the sensor structure, acquiring the corresponding sensor response signal, ascertaining a trim correction value for the at least one initial trim value on the basis of a previously determined relation between the sensor response signal and the trim correction value, and determining at least one current trim value for correcting the sensor signal, the determination of the at least one current trim value taking place on the basis of the at least one initial trim value and the ascertained trim correction value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.