Method for recalibrating a micromechanical sensor, and recalibrateable sensor
US11467012B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 7, 2019 |
| Grant date | Oct 11, 2022 |
| Priority date | — |
| Expiry date | Nov 29, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/0035
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Recalibrating a micromechanical sensor. The sensor is assigned a signal processing device for correcting the sensor signal on the basis of at least one previously determined initial trim value that is selected such that, given a defined sensor excitation, a production-related deviation of the sensor signal from a target sensor signal is compensated. The method for recalibrating the sensor includes: applying a defined electrical test excitation signal to the sensor structure, acquiring the corresponding sensor response signal, ascertaining a trim correction value for the at least one initial trim value on the basis of a previously determined relation between the sensor response signal and the trim correction value, and determining at least one current trim value for correcting the sensor signal, the determination of the at least one current trim value taking place on the basis of the at least one initial trim value and the ascertained trim correction value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.