Patent · US Active

Method for compensation in a measuring system

US11467033B2 · kind B2 · utility

0Cited by

2References

9Claims

0Family size

Assignee

Endress+Hauser Conducta GmbH+Co. KG · DE

Inventors

Frank Weber · San Diego, US
Thilo Krätschmer · Gerlingen, DE
Felicia Seichter · Ludwigsburg, DE

Key dates

Filing date	Aug 6, 2020
Grant date	Oct 11, 2022
Priority date	—
Expiry date	Aug 6, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG01J2003/2876
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a method for compensation for different sensitivities at different wavelengths in a spectrometric measuring system, including steps of calibrating the measuring system in a wavelength range with respect to one or more known reference standards, creating a wavelength-dependent compensation algorithm for linearization, and adjusting the measuring system using the compensation algorithm. The invention further discloses a corresponding measuring system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.