System, apparatus, and method for structural fault detection
US11467096B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 17, 2021 |
| Grant date | Oct 11, 2022 |
| Priority date | — |
| Expiry date | Dec 17, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/0232
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system, apparatus, and method for remotely detecting defects in a structure may proceed non-destructively. A mobile sensing platform may place sensors in a desired positioning relative to the structure. The desired position may include a non-contacting relation between the sensors and structure. The mobile sensing platform may project laser beams onto the structure and sense backscattered light via the sensors. Variations in the backscattered light may correspond to motion of the structure, such as vibrations. By calculating the frequency and amplitude of the vibrations, defects in the structure may be detected. By correcting for noise, such as that associated with acceleration of the mobile sensing platform, accuracy and precision of defect detection may be enhanced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.