Patent · US Active

Microwave dielectric analyzer

US11467102B2 · kind B2 · utility

0Cited by
5References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 18, 2019
Grant dateOct 11, 2022
Priority date
Expiry dateJul 18, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K1/024
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Various examples related to microwave dielectric analyzers and their use are provided. In one example, a microwave dielectric analyzer includes a measurement apparatus having a conductive electrode that can couple to a microwave analyzer and processing circuitry that can determine a dielectric characteristic of the dielectric specimen using a reflection coefficient measured by the microwave analyzer. The dielectric characteristic can be determined using a computational electromagnetic model of the measurement apparatus. The reflection coefficient can be measured by the microwave analyzer with the dielectric specimen in contact with the conductive electrode and/or sandwiched between conductive electrodes. The conductive electrodes can be axially aligned, and the second electrode may not be coupled to the microwave analyzer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.