Technologies for in-situ calibration of magnetic field measurements
US11467316B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 12, 2016 |
| Grant date | Oct 11, 2022 |
| Priority date | — |
| Expiry date | Mar 1, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, methods, and computer-readable media for in-situ calibration of magnetic field measurements. In some examples, a method can involve generating a magnetic field via a magnetic field source that is coupled to a downhole tool. The magnetic field source can be located within a fixed distance from one or more sensors coupled to the downhole tool. The method can also involve obtaining respective field measurements of the known magnetic field from the one or more sensors, and comparing the respective field measurements from the one or more sensors with respective reference measurements previously obtained from the one or more sensors to yield respective comparisons. The method can then involve determining, based on the respective comparisons, a respective sensitivity drift for each of the one or more sensors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.