System and method for projection of light pattern on work-piece
US11467556B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 4, 2019 |
| Grant date | Oct 11, 2022 |
| Priority date | — |
| Expiry date | Mar 20, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and a method for projection of a pattern of light on a work-piece are provided. The system includes an optical sensor, circuitry, and a projection device. The circuitry controls the optical sensor to capture a first plurality of light signals that bounces off from a surface of a work-piece and estimates a plurality of surface features of the work-piece based on the captured first plurality of light signals. The circuitry determines projection information for a pattern of light to be projected onto the surface of the work-piece based on the estimated plurality of surface features. Based on the determined projection information, the circuitry controls the projection device to project the pattern of light onto the surface of the work-piece.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.