Patent · US Revoked

System, method, and apparatus for rapid development of an inspection scheme for an inspection robot

US11472031B2 · kind B2 · utility

0Cited by
103References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 30, 2020
Grant dateOct 18, 2022
Priority date
Expiry dateMay 10, 2040

Classification

  • Technology area (CPC —)General

Abstract

Systems, methods and apparatus for rapid development of an inspection scheme for an inspection robot are disclosed. An apparatus may include an inspection definition circuit to interpret an inspection description value, and a robot configuration circuit to determine an inspection robot configuration description in response to the inspection description value. The apparatus may further include a configuration implementation circuit, communicatively coupled to a configuration interface of an inspection robot, to provide at least a portion of the inspection robot configuration description to the configuration interface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.