Patent · US Active

Test system

US11474137B2 · kind B2 · utility

0Cited by

20References

19Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Florian Ramian · Munich, DE
Werner Held · Pöcking, DE
Johannes Steffens · Rosenheim, DE

Key dates

Filing date	Sep 18, 2020
Grant date	Oct 18, 2022
Priority date	—
Expiry date	Sep 18, 2040

Classification

Technology area (CPC H)Electricity
CPC primaryH04B17/354
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

A test system for testing a device under test having at least an input port and an output port. The test system comprising a vector signal generator, a switch, a directional element, and a vector signal analyser. The vector signal generator, depending on the respective switching position of the switch, is connected with the input port of the device under test or the output port of the device under test such that, in a first switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the input port and, in a second switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the output port. The switch is configured to enable the vector signal analyser to perform reflection measurements and transmission measurements depending on the respective switching position of the switch.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.