Analyzing multidimensional process traces under edit-distance constraint
US11475032B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2019 |
| Grant date | Oct 18, 2022 |
| Priority date | — |
| Expiry date | Apr 11, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/9035
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system and computer program product for analyzing multidimensional data are disclosed. In embodiments, the method comprises obtaining an original set of data having a sequential order and multiple original dimensions; selecting a topic-based summarization scheme to summarize the original set of data; and applying the selected topic-based summarization scheme to the original set of data to transform the original set of data into a new set of data having fewer dimensions than the original set of data, while preserving, within a defined measure, the sequential order of the original set of data. In embodiments, the selecting a topic-based summarization scheme includes selecting a plurality of topics, each of the topic representing a set of the original dimensions. In embodiments, the applying the topic-based summarization scheme includes performing dimensionality reduction on the original set of data to transform the original dimensions to the topics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.