Inspection, analysis, classification, and grading of transparent sheets using segmented datasets of photoelasticity measurements
US11480532B2 · kind B2 · utility
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14Claims
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Key dates
| Filing date | Jan 13, 2019 |
| Grant date | Oct 25, 2022 |
| Priority date | — |
| Expiry date | Aug 13, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/45234
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and methods of inspecting, analyzing, classifying, and/or grading quality of a transparent sheet using a data set of photoelasticity measurements, thickness measurements, segmentation specifications, measurement specifications and quality control specifications of the transparent sheet. A results measurement is calculated on a computing system, quality control specifications are applied to the results measurement allowing writing to the database and creating reports, sending results to an operator interface and machine control.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.