Patent · US Active

Method and apparatus for detecting ageing of a power electronic apparatus comprising a semiconductor component, and power electronic system

US11480605B2 · kind B2 · utility

0Cited by

0References

16Claims

0Family size

Assignee

ZF FRIEDRICHSHAFEN AG · DE

Inventors

Marco Denk · Memmelsdorf, DE
Mark-Matthias Bakran · Erlangen, DE

Key dates

Filing date	Nov 22, 2016
Grant date	Oct 25, 2022
Priority date	—
Expiry date	Nov 30, 2039

Classification

Technology area (CPC H)Electricity
CPC primaryH01L2924/0002
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for detecting the aging of a power electronic device that comprises at least one semiconductor component including a step of providing of an excitation signal, which is designed to trigger a flow of an at least approximately semi-sinusoidal excitation current through the semiconductor component in order to introduce a power loss into the semiconductor component, a step of uploading a temperature signal, which represents the temporal course of the temperature of the semiconductor component, and a step of determining of an aging value that represents the aging of the power electronic device by using the temperature signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.