Method and/or system for testing devices in non-secured environment
US11480613B2 · kind B2 · utility
0Cited by
9References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2020 |
| Grant date | Oct 25, 2022 |
| Priority date | — |
| Expiry date | Dec 31, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L9/0894
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are methods, systems and devices for implementing built-in self-test (BIST) to be performed by an untrusted party and/or in an unsecure testing environment. In an embodiment, a test access port (TAP) on a device may enable a party to initiate execution of one or more BIST procedures on the device. Additionally, such a TAP may enable loading of encrypted instructions to be executed by one or more processors formed on a device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.