Automated localized machine learning training
US11481571B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 12, 2018 |
| Grant date | Oct 25, 2022 |
| Priority date | — |
| Expiry date | Aug 6, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W4/70
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Techniques for generating a machine learning model to detect event instances from physical sensor data, including applying a first machine learning model to first sensor data from a first physical sensor at a location to detect an event instance, determining that a performance metric for use of the first machine learning model is not within an expected parameter, obtaining second sensor data from a second physical sensor during a period of time at the same location as the first physical sensor, obtaining third sensor data from the first physical sensor during the period of time, generating location-specific training data by selecting portions of the third sensor data based on training event instances detected using the second sensor data, training a second ML model using the location-specific training data, and applying the second ML model instead of the first ML model for detecting event instances.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.