Patent · US Active

Method for photocopying a sequence of cut surfaces inside a light-scattering object with improved scanning

US11482044B2 · kind B2 · utility

0Cited by

2References

6Claims

0Family size

Assignee

Visotec GmbH · DE

Inventors

Helge Sudkamp · Lübeck, DE
Hendrik Spahr · Lübeck, DE
Dierck Hillmann · Lübeck, DE
Peter Koch · Wulfen, DE
Gereon Hüttmann · Wulfen, DE

Key dates

Filing date	Feb 5, 2019
Grant date	Oct 25, 2022
Priority date	—
Expiry date	May 9, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG03H2222/24
WIPO fieldOptics
WIPO sectorInstruments

Abstract

The invention relates to a free-beam interferometric method for illuminating a sequence of sectional areas in the interior of the light-scattering object. The method makes it possible for the user to select a larger image field and/or a higher image resolution than previously possible with the occurrence of self-interference of the specimen light from a scattering specimen.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.