System and method for fully integrated regression and system testing analytics
US11487648B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 9, 2021 |
| Grant date | Nov 1, 2022 |
| Priority date | — |
| Expiry date | Mar 9, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3692
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Various methods, apparatuses/systems, and media for automatically generating fully integrated regression and system testing (FIRST) analytics are disclosed. A processor accesses a production database to obtain production data associated with an application, and accesses a user acceptance testing (UAT) database to obtain UAT data associated with the application. The processor generates gap data on test coverage based on comparing the production data with the UAT data; analyzes the generated gap data; automatically generates, in response to analyzing the generated gap data, executable full coverage of test scenarios for testing the application; and automatically executes testing of the application based on the generated test scenarios.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.