Multi-frequency dielectric coaxial probe for formation analysis
US11493465B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 30, 2020 |
| Grant date | Nov 8, 2022 |
| Priority date | — |
| Expiry date | May 12, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/041
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods to evaluate a formation by analyzing drill cuttings involve a multi-frequency dielectric coaxial probe to obtain a reflected voltage from a medium under test based on a reference voltage over a frequency range. The medium under test includes the drill cuttings. The system includes a processor to compute an effective permittivity of the drill cuttings over the frequency range based on a reflection coefficient, which is a ratio of the reflected voltage to the reference voltage over the frequency range, and to determine one or more parameters from the effective permittivity. The one or more parameters are used to make decisions about subsequent drilling in the formation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.