Power amplifiers testing system and related testing method
US11493563B2 · kind B2 · utility
1Cited by
1References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Oct 30, 2019 |
| Grant date | Nov 8, 2022 |
| Priority date | — |
| Expiry date | Feb 14, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03F2203/45621
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A testing system includes: a signal generator arranged to generate a testing signal; a dividing circuit coupled to the signal generator for providing a plurality of input signals according to the testing signal; and a plurality of power-amplifier chips coupled to the dividing circuit for being tested by generating a plurality of output signals for a predetermined testing time according to the plurality of input signals respectively.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.