Hardware-controlled updating of a physical operating parameter for in-field fault detection
US11494370B2 · kind B2 · utility
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Key dates
| Filing date | Mar 20, 2020 |
| Grant date | Nov 8, 2022 |
| Priority date | — |
| Expiry date | Jan 1, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/273
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Latency of in-system test (IST) execution for a hardware component of an in-field (deployed) computing platform may be reduced when a value of a physical operating parameter can be changed without rebooting the computing platform. A test (e.g., patterns or vectors) is executed for varying values of the physical operating parameter (e.g., supply voltage, clock speed, temperature, noise magnitude/duration, operating current, and the like), providing the ability to detect faults in the hardware components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.