Image alignment for noisy images
US11494924B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 10, 2020 |
| Grant date | Nov 8, 2022 |
| Priority date | — |
| Expiry date | May 8, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems for aligning images of a specimen are provided. One method includes reducing noise in a test image generated for a specimen by an imaging subsystem thereby generating a denoised test image. The method also includes detecting one or more patterned features in the denoised test image extending in at least a horizontal or vertical direction. In addition, the method includes designating an area of the denoised test image in which the detected one or more patterned features are located as a region of interest in the denoised test image. The method further includes aligning the denoised test image to a reference image for the specimen using only the region of interest in the denoised test image and a corresponding area in the reference image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.