Extinction ratio testing system for optical transceiver module and extinction ratio testing method for optical transceiver module
US11496214B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 27, 2021 |
| Grant date | Nov 8, 2022 |
| Priority date | — |
| Expiry date | Sep 27, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/10
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An extinction ratio testing system (10) includes a microcontroller (102), an extinction ratio tester (104), and a thermostat (106). The microcontroller (102) controls the thermostat (106) to maintain an optical transceiver module (20) at a predetermined high temperature, and then the microcontroller (102) controls the extinction ratio tester (104) to test an extinction ratio of the optical transceiver module (20). If the extinction ratio is lower than a standard extinction ratio, the microcontroller (102) controls the optical transceiver module (20) to increase a laser operating current (212) of the optical transceiver module (20) to increase the extinction ratio.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.