Patent · US Active

Endoscope cleaning and inspection system and method

US11497581B2 · kind B2 · utility

0Cited by
27References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 1, 2019
Grant dateNov 15, 2022
Priority date
Expiry dateNov 1, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04N23/555
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Embodiments of a system and method for endoscope cleaning and inspection are disclosed. In an example, an endoscope cleaning and inspection unit includes cleaning and testing capabilities operated via control equipment and a display screen, to operate leak testing equipment, flush control equipment, and optical inspection equipment for leak testing, flushing, rinsing, and inspection of an endoscope interior chamber (lumen) and exterior surfaces. In a further example, the endoscope cleaning and inspection unit may further operate and receive information from a borescope imaging device or a magnification imaging device, using an imaging sensor to capture images of an endoscope lumen or surface respectively, as captured or output on the display screen. Further embodiments provide for control, monitoring, data collection, data input, and data output with such imaging devices via the endoscope cleaning and inspection unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.