Circuit screening system and circuit screening method
US11500016B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2020 |
| Grant date | Nov 15, 2022 |
| Priority date | — |
| Expiry date | Apr 23, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31721
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A circuit screening system includes a target circuit under test, a power circuit, and a clock generating circuit. The target circuit under test receives a first testing signal in a first period, and a second testing signal in a second period, and the first testing signal is different from the second testing signal. The power circuit provides a supply voltage to the target circuit under test, wherein a voltage level of the supply voltage maintains at a first voltage level in the first period, is pulled up to a second voltage level and back to the first level after the first period, and maintains at the first voltage level in a second period after the first period. The clock generating circuit provides a clock signal to the target circuit under test, wherein the clock signal has different profiles in the first period and the second period.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.