Time-of-flight measurements using linear inverse function
US11500100B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 15, 2019 |
| Grant date | Nov 15, 2022 |
| Priority date | — |
| Expiry date | Sep 15, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/894
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
One example provides a time-of-flight depth imaging system configured to modulate light emitted from a light source to illuminate an environment with modulated light, and for each of one or more modulation frequencies, integrate an image at each phase step of a plurality of phase steps, and sense a temperature of the light source and/or image sensor via one or more temperature sensors to acquire a measured temperature. The instructions are further executable to, and for each pixel of one or more pixels of the image sensor, determine a complex phasor based upon the measured temperature using a linear inverse function for each modulation frequency, determine a phase shift between the light emitted from the light source and light from the light source reflected back by the environment based on the complex phasor, and output a depth value for the pixel based upon the phase shift.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.