Machine device state monitoring system and machine device state monitoring method
US11501421B2 · kind B2 · utility
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Key dates
| Filing date | Apr 3, 2019 |
| Grant date | Nov 15, 2022 |
| Priority date | — |
| Expiry date | May 14, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A machine device state monitoring system includes an image data acquisition unit that acquires image data of an inside of a housing chamber in which a mechanical part is housed, an image analysis unit that outputs foreign substance data relating to a foreign substance in oil in the housing chamber based on the image data, a storage unit that stores characteristic data indicating a characteristic of the foreign substance, and an estimation unit that estimates a state of a machine device having the mechanical part based on the foreign substance data and the characteristic data to output estimation data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.