Method for calibrating defective channels of a CT device
US11504085B2 · kind B2 · utility
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Key dates
| Filing date | Jul 24, 2019 |
| Grant date | Nov 22, 2022 |
| Priority date | — |
| Expiry date | Jun 25, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2211/441
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for calibrating defective channels of a CT device involves in a step S10, acquiring original data collected by the CT device; in a step S20, capturing to-be-recovered areas from the original data, wherein the to-be-recovered areas contain the defective channels of the CT device; in a step S30, inputting data of the to-be-recovered areas to a neural network for training so as to generate training results; and in a step S40, using the training results to repair the to-be-recovered areas. The method eliminates effects of artifacts caused by defective channels on image reconstruction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.