Refractive-index sensor and method
US11506602B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | May 13, 2019 |
| Grant date | Nov 22, 2022 |
| Priority date | — |
| Expiry date | May 13, 2039 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y20/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring a refractive index of a medium includes exciting a first antisymmetric resonance of a first metasurface, including a first periodic array of resonators formed on a substrate surface, with illumination incident on the first metasurface at a non-normal incidence angle with respect to the substrate surface, the first metasurface including the medium encapsulating the first periodic array of resonators. The method also includes determining a refractive index of the medium from a first amplitude of a first transmitted signal that includes a portion of the illumination transmitted through the first metasurface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.