Method and system for prioritizing system under test configurations

US11507602B2 · kind B2 · utility

Assignee

• Dell Products L.P. · US

Inventors

• Ramakanth Kanagovi · Kanchinakote, IN
• Saheli Saha · Sherghati, IN
• Kevin P. Olalde · McMurray, US
• Geoffrey S. Meyer · Austin, US
• Sunil A. Vyas · Laguna Niguel, US
• Erik Reyes · San Saba, US

Key dates

• Filing date: Oct 31, 2019
• Grant date: Nov 22, 2022
• Expiry date: Jul 3, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G06N20/20
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A system, method, and computer-readable medium are provided that engages in a data-driven and machine learning-based approach to arrive at high-value, system under test configurations for validation. Embodiments determine all the possible configurations for a computer platform, considering the variety of processors, boards, adapters, and the like, and then utilize a pseudo-ensemble clustering methodology that combines a k-means clustering technique with a neural-network based Kohenon self-organizing map competitive clustering technique to associate like configurations, and then utilizes a data-driven scoring methodology on the clustered configurations to prioritize those configurations to be validation tested.