Inspection systems and methods including image retrieval module
US11507616B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 3, 2020 |
| Grant date | Nov 22, 2022 |
| Priority date | — |
| Expiry date | May 25, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N3/09
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.