Analysis apparatus, analysis method, and analysis program for calculating prediction error and extracting error factor
US11507881B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 13, 2018 |
| Grant date | Nov 22, 2022 |
| Priority date | — |
| Expiry date | Sep 11, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An analysis apparatus comprises: a processor; and a storage device that stores a prediction model that predicts results for contributing factors of a group of events, wherein the processor executes: a prediction error calculation process in which, on the basis of a first prediction value attained by providing the prediction model with a first appearance frequency for contributing factors of a first event among the group of events, and results corresponding to the first appearance frequency, a prediction error of the first prediction value is calculated; and an error factor extraction process in which, on the basis of a correlation between a second appearance frequency for a contributing factor of a second event among the group of events and the prediction error calculated by the prediction error calculation process, an error factor of the prediction error is extracted from among the contributing factors of the first event.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.