Patent · US Active

System, method, and apparatus for rapid development of an inspection scheme for an inspection robot

US11511426B2 · kind B2 · utility

36Cited by
103References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 30, 2020
Grant dateNov 29, 2022
Priority date
Expiry dateApr 30, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05D1/0038
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems, methods and apparatus for rapid development of an inspection scheme for an inspection robot are disclosed. An apparatus may include an inspection definition circuit to interpret an inspection description value, and a robot configuration circuit to determine an inspection robot configuration description in response to the inspection description value. The apparatus may further include a configuration implementation circuit, communicatively coupled to a configuration interface of an inspection robot, to provide at least a portion of the inspection robot configuration description to the configuration interface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.