System, method, and apparatus for rapid development of an inspection scheme for an inspection robot
US11511426B2 · kind B2 · utility
Assignee
Inventors
- Edward A. Bryner
- Kevin Y. Low
- Joshua Moore
- Dillon R. Jourde
- Francesco H. Trogu
- Jeffrey J. Mrkonich
- William J. Pridgen
- Domenic P. Rodriguez
- Alexander C. Watt
- Michael Stephen Auda
- Logan MacKenzie
- Ian Miller
- Samuel Theodore Westenberg
- Katherine Virginia Denner
- Benjamin A. Guise
- Yizhu Gu
- Todd Joslin
- Mark Loosararian
- Mark Cho
- Edwin H. Cho
Key dates
| Filing date | Apr 30, 2020 |
| Grant date | Nov 29, 2022 |
| Priority date | — |
| Expiry date | Apr 30, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05D1/0038
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, methods and apparatus for rapid development of an inspection scheme for an inspection robot are disclosed. An apparatus may include an inspection definition circuit to interpret an inspection description value, and a robot configuration circuit to determine an inspection robot configuration description in response to the inspection description value. The apparatus may further include a configuration implementation circuit, communicatively coupled to a configuration interface of an inspection robot, to provide at least a portion of the inspection robot configuration description to the configuration interface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.