System, apparatus and method for providing an inspection map
US11511427B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 8, 2020 |
| Grant date | Nov 29, 2022 |
| Priority date | — |
| Expiry date | May 8, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05D1/0038
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, apparatus and methods for providing an inspection map are disclosed. An apparatus for performing an inspection may include an inspection data circuit to interpret inspection data, a robot positioning circuit to interpret position data, and a processed data circuit to link the inspection data with the position data to determine position-based inspection data. The apparatus may further include a user interaction circuit to interpret an inspection visualization request for an inspection map and an inspection visualization circuit to determine the inspection map based on the position-based inspection data, and a provisioning circuit structured to provide the inspection map to a user device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.