Patent · US Active

System, apparatus and method for providing an inspection map

US11511427B2 · kind B2 · utility

1Cited by
103References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 8, 2020
Grant dateNov 29, 2022
Priority date
Expiry dateMay 8, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05D1/0038
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems, apparatus and methods for providing an inspection map are disclosed. An apparatus for performing an inspection may include an inspection data circuit to interpret inspection data, a robot positioning circuit to interpret position data, and a processed data circuit to link the inspection data with the position data to determine position-based inspection data. The apparatus may further include a user interaction circuit to interpret an inspection visualization request for an inspection map and an inspection visualization circuit to determine the inspection map based on the position-based inspection data, and a provisioning circuit structured to provide the inspection map to a user device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.