Patent · US Active

Machine learning based impact analysis in a next-release quality assurance environment

US11513819B2 · kind B2 · utility

0Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 7, 2020
Grant dateNov 29, 2022
Priority date
Expiry dateJan 28, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N20/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Aspects of the disclosure relate to impact analysis in a next-release quality assurance environment for a software application. First log data associated with user navigation of user interface components in a production environment may be retrieved. A production navigational graph may be generated, where a node represents a user interface component visited by a user, and an edge representing a navigational link traversed by the user. Then, second log data associated with release notes for a next-release version of the software application maybe retrieved. Then, the computing platform may identify a change in a portion of a software code in the next-release version, and may identify, based on the production navigational graph, a user interface component and/or a link potentially impacted by the change. The production navigational graph may be provided, via an interactive graphical user interface, where the user interface component and/or the link is visually highlighted.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.