Methods, system and devices for panel marking and formability measurements, including autonomous methods and devices
US11517983B2 · kind B2 · utility
Inventor
Key dates
| Filing date | Aug 24, 2020 |
| Grant date | Dec 6, 2022 |
| Priority date | — |
| Expiry date | Aug 24, 2040 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB23K26/16
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A method, system and devices for autonomous marking of a substrate and for conducting formability measurements. The method, system and devices may be used to apply markings to a substrate, such as panels that are used to construct articles. The panels, for example, may be automobile panels. The markings preferably are applied on the panel autonomously with a laser etching, and with robot device that is controlled to form a precise pattern of indicia (e.g., dots), on the panel surface. An x, y, z, gantry coordinate system may be used to guide the operations of the robot device to position the device for etching at precise locations on the substrate surface. Once etched, the panels may be processed, such as, by stamping or cutting, and the deformation of the dot pattern may be used to determine strain and formability properties.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.