Apparatus and method to achieve fast-fault detection on power semiconductor devices
US11519954B2 · kind B2 · utility
2Cited by
13References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Jul 21, 2020 |
| Grant date | Dec 6, 2022 |
| Priority date | — |
| Expiry date | Jan 12, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/42
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and methods to operate the same to provide fast fault-detection on power semiconductor devices such as power transistors are disclosed. In some embodiment, a desaturation based fault-detection circuit for a power transistor is provided. The fault-detection circuit has an adaptable blanking time and a disconnect switch in the blanking mechanism that allow for quick enabling of fault-detection mechanisms to achieve fast fault detection times on power semiconductor devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.