Patent · US Active

Manufacturing optimization using a multi-tenant machine learning platform

US11520322B2 · kind B2 · utility

2Cited by
0References
16Claims
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Key dates

Filing dateMay 26, 2020
Grant dateDec 6, 2022
Priority date
Expiry dateMay 26, 2040

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/02
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Techniques for manufacturing optimization using a multi-tenant machine learning platform are disclosed. A method for manufacturing optimization includes: obtaining physical sensor data, by a manufacturing device associated with a tenant of a multi-tenant machine learning platform; determining, by a machine learning spoke system associated with the tenant, a machine learning parameter based on at least the physical sensor data; preventing exposure of the first physical sensor data of the first manufacturing device to any other tenant of the multi-tenant machine learning platform; transmitting the machine learning parameter from the machine learning spoke system to a machine learning hub system of the multi-tenant machine learning platform; and updating, by the machine learning hub system, a multi-tenant machine learning model based at least on the machine learning parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.