Method and system for checking data gathering conditions associated with image-data during AI enabled visual-inspection process
US11521313B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 11, 2021 |
| Grant date | Dec 6, 2022 |
| Priority date | — |
| Expiry date | Aug 5, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20224
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for checking data gathering conditions or image capturing conditions associated with images during AI based visual-inspection process. The method comprises generating a first representative (FR1) image for a first group of images and a second representative image (FR2) for a second group of images. A difference image data is generated between FR1 image and the FR2 image based on calculating difference between luminance values of pixels with same coordinate values. Thereafter, one or more of a plurality of white pixels or intensity-values are determined within the difference image based on acquiring difference image data formed of luminance difference-values of pixels. An index representing difference of data-capturing conditions across the FR1 image and the FR2 image is determined, said index having been determined at least based on the plurality of white pixels or intensity-values, for example, based on application of a plurality of AI or ML techniques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.