System and method to correct for variation of in-focus plane across a field of view of a microscope objective
US11523046B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 3, 2019 |
| Grant date | Dec 6, 2022 |
| Priority date | — |
| Expiry date | Jul 31, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/56
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A computer implemented system and method for generating a focus corrected image of a sample disposed on a sample holder of an imaging system is disclosed. The imaging system includes an image sensor and a lens moveable relative to the image sensor between a first position and a second position. A characteristic map of the lens is developed that associates coordinates of each pixel of an image generated by the imaging sensor with one of a first plurality of locations of the lens between the first position and the second position. An image generator develops an output pixel of a focus-corrected image of a sample from a plurality of images of the sample acquired when the lens is positioned at a corresponding one of a second plurality of locations of the lens between the first position and the second position. The image generator selects a second location in accordance with the characteristic map, an image from the plurality of images of the sample associated with the second location, and determines a value of the output pixel in accordance with a value of a pixel of the selected one of the plurality of images that corresponds to the output pixel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.