Field probe isotropic compensation using orthogonal scalar field components
US11525852B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 13, 2019 |
| Grant date | Dec 13, 2022 |
| Priority date | — |
| Expiry date | Jul 20, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R35/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, system and apparatus for compensating for non-ideal isotropic behavior of a field probe are disclosed. A method includes, during a calibration procedure, for each of a plurality of positions of the field probe relative to a source, each position denoted by a set of angles (θ, ϕ), performing the following steps: measuring a field by the sensors of the probe, storing the measurements and the set of angles (θ, ϕ) for each measurement, computing a correction factor for the set of angles (θ, ϕ) based on the measurement, and storing the correction factors. During a measurement procedure, each sensor measures a component of the field. A set of angles is determined based on the sensor measurements, and a correction factor is determined based on the set of angles. The correction factor may then be multiplied by the sensor measurements to obtain the corrected field measurements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.